【作者】 刘丰； 章洪燕； 邓智； 刘以农；

【Author】 LIU Feng;ZHANG Hongyan;DENG Zhi;LIU Yinong;Dept.of Tsinghua University;Key Laboratory of Particle& Radiation Imaging (Tsinghua University),Ministry of Education;

【机构】 清华大学工程物理系； 粒子技术与辐射成像教育部重点实验室(清华大学)；

【摘要】 本文搭建了低温下(77K)基于SCA技术的波形数字化测试系统。该测试系统中的SCA芯片是一款集成了开关电容阵列波形采样以及串行化输出功能的32通道专用集成电路,其最大采样速率为50MSPS,读出率为16MHz,每个通道有64个采样电容,该芯片是由0.18umCMOS工艺制造。该芯片常温线性度测试积分非线性为0.39%,低温测试结果表明SCA芯片在温度降低时,偏置电流会减小,通过调整偏置电流至设计值时,可以得到比常温更好的有效精度。更多还原

【Abstract】 A low temperature(77 K) waveform digitization system based on switched capacitor array ASIC has been built up. The SCA ASIC used in the system integrates 32 channels with waveform sampling and serial output. The sampling rate of the SCA can reach up to 50 MSPS and readout rate of 16 MHz. The ASIC is fabricated with 0.18 um COMS process. The INL of the SCA can reach 0.39% at room temperature. The cryogenic test showed the bias current will decrease with the temperature lows down. It can achieve better performance compared to room temperature with adjusting the bias current to the same at room temperature.更多还原