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基于双共焦传感器的薄膜厚度测量技术
Measurement of Thickness of Foils Based on Conjugated Confocal Micro-Displacement Sensors
【Author】 YANG Meng-sheng,XING Pi-feng,GAO Dang-zhong,MA Xiao-jun,LI Chao-yang (China Acadeny of Engineering Physics,Mianyang 621900,China)
【机构】 中国工程物理研究院;
【摘要】 研究了基于双共焦传感器的薄膜厚度测量技术,搭建实际系统对自支撑Au、Mo膜进行测量。结果表明,该系统有效消除了薄膜翘曲、不完全展平的影响,测量精度达到干涉仪水平。
【Abstract】 The measurement of the thickness of foils is crucial to the studies on the equation of state (EOS) based on laser driven shock waves. The new method by means of conjugated confocal micro-displacement sensors was studied. An instrument was set up,and some warped foils were measured with it. The results indicate that the curve of specimen surface is avoided,and the precision is identical to the interfrometer.
- 【会议录名称】 第六届(2010年)北京核学会核技术应用学术交流会论文集
- 【会议名称】第六届(2010年)北京核学会核技术应用学术交流会
- 【会议时间】2010-10-17
- 【会议地点】中国江苏苏州
- 【分类号】TP212.9;TB302
- 【主办单位】北京核学会