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机载光电稳定系统结构预测

Structure prediction of airborne photoelectric stable system

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【作者】 程志峰金辉郎小龙孔德杰盖竹秋李明

【Author】 Cheng Zhifeng~(1,2) Jin Hui~2 Lang Xiaolong~2 Kong Dejie~2 Ge Zhuqiu~2 Li Ming~2 (1.Key Laboratory of Airborne Optical Imaging and Measurement,Changchun Institute of Optics,Fine Mechanics and Physics, Chinese Academy of Sciences,Changchun 130033,China;2.Changchun Institute of Optics,Fine Mechanics and Physics,Chinese Academy of Sciences,Changchun 130033,China)

【机构】 中国科学院长春光学精密机械与物理研究所中国科学院航空光学成像与测量重点实验室中国科学院长春光学精密机械与物理研究所

【摘要】 为了有效地提高机载光电稳定系统结构可靠性,提出了结构关键件及整机预测方案。首先,进行了针对机载光电平台外方位框架,建立了几何模型和有限元模型,进行了初步的静力学分析和模态分析。并根据有限元分析结果,以结构的壁厚作为设计变量,结构最大变形作为约束条件,实现了结构质量最小的目的。优化结果表明,在保证结构基频大于150hz的基础上,外方位框架质量减小了1.1kg,壁厚及加强筋厚度减小了1.0mm。进而对整个光电平台整机进行了多种环境试验和精度检测,顺利通过各项试验考核,并通过不同天气条件下外场多次试飞,工作稳定可靠。研究内容在实际工程应用中得到了很好的展现。

【Abstract】 In order to enhance the reliability of airborne photoelectric stable system efficiently,the structure prediction scheme is introduced.The finite element model and geometry model of the airborne photoelectric platform are established,a preliminary static analysis and modal analysis are conducted.And according to the results of structure’s static analysis and modal analysis,by defining the structure thickness as design variable,the structure deformation as constraints,the structure is optimized and the minimum quality structure is achieved,which give a design scheme of the outer azimuth framework system.The results shows that the thick of outer frame decrease 1.0mm,and the mass decrease 1.1kg accordingly based on the frequency up to 150hz.Several environment test and precision testing are given to the photoelectric platform,the system smoothly pass through the test evaluation,actual stable accuracy reaches 20urad,and system is stable and reliable through many trial flights in different weather conditions.The research content achieves a good show in practical engineering application.

【基金】 武器装备预研基金资助项目(No.51460040104ZK1001)
  • 【会议录名称】 2011中国仪器仪表与测控技术大会论文集
  • 【会议名称】2011中国仪器仪表与测控技术大会
  • 【会议时间】2011-10
  • 【会议地点】中国北京
  • 【分类号】V225
  • 【主办单位】中国仪器仪表学会
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