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用阱作高阻漂移区的LDMOS导通电阻的解析模型
An Analytical Model of LDMOS On-resistance for Using a Well as a High Resistance Drift Region
【作者】 孟坚; 高珊; 陈军宁; 柯导明; 孙伟锋; 时龙兴; 徐超;
【Author】 Meng Jian[1] Gao Shan[1] Chen Junning[1] Ke Daoming[1] Sun Weifeng[2] Shi Longxing[2] Xu Chao[1] ([1]Electronic Science and Technology School,Anhui University,Hefei 230039,PRC;[2]National ASIC System Engineering Research Center,Southeast University,Nanjing 210096,PRC)
【机构】 安徽大学电子科学与技术学院; 东南大学国家ASIC工程中心;
【摘要】 分析了一个用阱作为耐高压漂移区的LDMOS的导通电阻,提出了带有场极板的高阻漂移区导通电阻的计算公式,改进了双扩散沟道导通电阻的计算公式。对一个LDMOS的例子做了计算,并将其与相同参数情况下用MEDICI软件模拟的结果作了对比。结果表明两者相差仅有5%,这说明所得公式可用于该类型LDMOS的分析和设计。
【Abstract】 A theory for an on-resistance of LDMOS using a well as a high resistance drift region was developed.The calculation formulas of a drift region on-resistance with field plate were given,and also a calculation formula of a double-diffused channel on-resistance was improved.An example was not only computed by formulas given by the paper,but also simulated by MEDICI program.It shows that the difference between two results was lower than 5%.It is verified that the formulas given by the paper can help to design and analyze LDMOS.
【Key words】 Well Region; Double-Diffused MOS Transistor; On-Resistance; Analytical Model.;
- 【会议录名称】 2005年“数字安徽”博士科技论坛论文集
- 【会议名称】2005年“数字安徽”博士科技论坛
- 【会议时间】2005-12-10
- 【会议地点】中国安徽合肥
- 【分类号】TN386.1
- 【主办单位】安徽省科学技术协会、安徽省信息产业厅