【作者】 吴韵秋； 唐宗熙； 张彪；

【Author】 Yunqiu Wu Zongxi Tang Biao Zhang (School of Electronic Engineering,University of Electronic Science and Technology of China,Chengdu 610054)

【机构】 电子科技大学电子工程学院；

【摘要】 提出了一种确定铁磁薄膜复磁导率的新方法。该方法将终端短路微带线微扰法结合多层微带结构特性进行分析,以确定各层介质的相对磁导率与微带结构的等效磁导率之间的关系,避免采用参考样品进行校准,也不需对静态饱和磁导率进行测试,并且充分考虑了同轴-微带-多层微带之间的不连续性,大大降低了测试的复杂程度,提高了测试的准确度。本文在0.5-15GHz频率范围内对铁磁薄膜材料进行了分析与测试,实验结果表明,本文提出的测试方法能在较宽的频带内准确地确定铁磁薄膜的复磁导率。更多还原

【Abstract】 A new method for measuring the permeability of ferromagnetic thin films is proposed in this paper. Shorted microstrip transmission-line perturbation is used to obtain the effective permeability of the multilayer microstrip,and conformal mapping method is used to extract the complex permeability of ferromagnetic thin film from the effective permeability.The method proposed in this paper fully considerate the discontinuation of coaxial-microstrip -multilayer microstrip,so it decreases the complexity of measurement remarkably.To validity this new method,the ferromagnetic thin film is measurement from 0.5GHz to 15GHz,and comparisons are performed between the theoretical result and testing result.The results show that the complex permeability of ferromagnetic thin films can be measured accurately and conveniently by using this proposed method.更多还原