【作者】 孙蓓云； 周辉； 陈向跃； 毛从光；

【Author】 Sun Beiyun Zhou Hui Cheng xiangyue Mao Congguang (Northwest Institute of Nuclear Technology Xi’an 710024 China)

【机构】 西北核技术研究所；

【摘要】 本文采用正态分布、对数正态分布、Weibull分布和Gumbel分布对采用电流注入方法获取的30个固体继电器的电磁脉冲损伤阈值进行了拟合,比较了不同分布拟合结果之间的差异,为开展相关电子系统易损性分析打下基础。更多还原

【Abstract】 In this paper,the thirty EMP damage threshold of solid state relays which were obtained by current injection method was fitted by normal distribution,lognormal distribution, weibull distribution and minimal gumbel distribution,the difference among them was compared.更多还原