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退火温度对铁电薄膜钛酸锶钡的影响

EFFECT OF ANNEALING TEMPERATURE ON FERROELECTRIC BARIUM STRONTIUM TITANATE THIN FILMS

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【作者】 韦其红赵振华付兴华侯文萍

【Author】 Wei Qihong Zhao Zhenhua Fu Xinghua Hou Wenping (Department of Materials Science and Engineering, Jinan University, Jinan 250022) (The Exploitation Service Center of Materials of City Construction, Jinan 250032)

【机构】 济南大学材料科学与工程学院济南市城建材料开发服务中心

【摘要】 用醋酸盐和钛酸酯为原料,采用Sol-Gel工艺在Pt/TiO2/SiO2/Si基片上制备出Ba0.5Sr0.5TiO3(BST)铁电薄膜,然后在650-800℃下对BST薄膜进行退火,研究退火温度对钛酸锶钡铁电薄膜的影响。X射线衍射分析表明:退火温度在750℃以上时,BST薄膜转变成较为完整的ABO3型钙钛矿结构;SEM分析表明:750℃热处理的薄膜颗粒较大,且颗粒生长较好;阻抗分析仪测试表明:750℃退火处理的薄膜介电性能最佳;TEM分析表明:750℃晶粒发育完善、清晰,晶粒与晶粒之间比较紧密,且存在微畴区域。

【Abstract】 Barium strontium titanate films with higher properties have been obtained by sol-gel processing on Pt/TiO2/SiO2/Si substrate using barium acetate, strontium acetate and titanium-tetrabutoxide as starting materials. X-rays diffraction revealed that at 750℃ the BST films had crystallized into ABO3 perovskite phase. Analysis indicated that large,uniform grains, and the best dielectric properties were obtained at 750℃. Analysis by TEM revealed that grains were crystallized better,close to each other, and micro-domains were detected at 750℃.

【关键词】 BST退火X射线衍射介频谱
【Key words】 BSTannealingX-ray diffractiondielectric constant-frequency
  • 【会议录名称】 中国硅酸盐学会陶瓷分会2005学术年会论文专辑
  • 【会议名称】中国硅酸盐学会陶瓷分会2005学术年会
  • 【会议时间】2005
  • 【会议地点】中国
  • 【分类号】TQ132.35
  • 【主办单位】中国硅酸盐学会陶瓷分会
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