【作者】 陶峰；

【Author】 Tao Feng (National ASIC System Engineering Research Center, Southeast University, Nanjing, 210096)

【机构】 东南大学国家专用集成电路系统工程技术研究中心；

【摘要】 本文介绍了一种射频阻抗测量夹具的建模及去嵌入技术。分析了简单阻抗测量夹具中由于阻抗不连续以及结构变换引起的反射,分别建立PCB板上微带传输线的模型、同轴至微带线的转接模型以及从测量结果中去嵌入夹具影响的方法。使用自制的测量夹具测量 0603封装的贴片器件,并利用文中的方法进行建模和去嵌入处理,最终获得贴片器件的射频特性;同时得到微带线的特性,实际验证了该方法的正确性。更多还原

【Abstract】 The modeling and de-embedding of high frequency impedance test-fixture was mentioned here. The reflectance caused by the transitions and impedance discontinuities of the text-fixture were discussed first. Then models of the transitions and discontinuities were brought forward. The model of microstrip line on the PCB board was also discussed here. With the self-designed test-fixture some 0603 elements were measured and the results were treated with the method introduced in this article. Finally we obtain both the 0603 elements’ and the microstrip line’s characterization in the RF region. And these practically prove the accuracy of this method.更多还原