【作者】 朱彦卿； 何怡刚； 阳辉； 刘美容； 王玺；

【Author】 Zhu Yan-qing He Yi-gang Yang Hui Liu Meirong Wang Xi (College of Electrical and Information Engineering of Hunan University, China Electronic Product Reliability and Environmental Testing Research Institute)

【机构】 湖南大学电气与信息工程学院；

【摘要】 针对混合信号电路的测试问题,提出了一种内建自测试(BIST)结构,分析并给出了如何利用该结构来计算计算片上高速模数转换器(ADC)的静态参数。该方法利用三角波信号作为测试激励,采用码密度直方图分析方法快速计算ADC的各静态参数。根据改进测试算法所构造的BIST结构实现了芯片内只有ADC电路的可测性设计,而不需要用到片内集成 DSP。内嵌的信号发生器能自动生成高频连续三角波测试信号,适合高速ADC的测试。该BIST 结构精简了电路规模,减少了硬件开销,易于片上集成。更多还原

【Abstract】 Aiming at the mixed-signal circuit testing, an integrated BIST architecture for testing on-chip high speed ADC was presented. The static parameters of ADC were extracted from the histogram of ADC’s out codes, which stimulated with triangle-wave signal. The presented on-chip signal generation provided accuracy stimulant signal for high speed ADC testing, and the response analyzer calculated the parameters quickly with minimized circuits. The BIST has the advantages of high testing speed, simple structure and low area overhead for easily integrated on chip.更多还原