【作者】 郝苇苇； 张峰； 刘晓清； 周勇亮；

【Author】 HAO Weiwei, ZHANG Feng, LIU Xiaoqing, ZHOU Yongliang (Department of Chemistry and The Key Laboratory for Chemical Biology of Fujian Province, College of Chemistry and Chemical Engineering, Xiamen University)

【机构】 厦门大学化学化工学院化学系化学生物学福建省重点实验室；

【摘要】 作为高信息量的原位检测方法表面增强拉曼光谱(SERS)在芯片领域具有重要意义。本文利用电化学氧化还原(ORC)粗糙法在微反应芯片上制备具有SERS活性的银基底,并用于原位检测亚胺生成反应。得到SERS信号最高可达7000cps。更多还原

【Abstract】 Offering a mass of information for probing the chemical and structural properties of a sample on a microscopic scale, Surface-Enhanced Raman Scattering (SERS) is a hopeful detection method for microchip. After fabrication of SERS-active Ag substrate in a glass-PDMS chip by the electrochemical oxidation-reduction-cycle (ORC) roughening, the imine formation reaction was monitored, and enhanced signal obtained was more than 7000cps.更多还原