【作者】 王银峰； 杨学恒； 刘安平； 周维；

【Author】 Wang Yinfeng Yang Xueheng Liu Anping Zhou Wei Chongqing University .Chongqing,400044

【机构】 重庆大学；

【摘要】 分析了纳米绝缘材料薄层在适当的偏压电场下STM检测的机理,用自行研制的STM.IPC-205B型扫描隧道显微镜实现了对部分绝缘纳米材料微观形貌的检测,得到了理想的图像。拓展了STM检测加工技术的应用领域,进一步发挥了STM在材料结构和性能研究方面精度高、稳定性强等优势。更多还原

【Abstract】 We analyzed the mechanism that STM can scan insulated films if they were thin enough and located in a proper bias voltage field. Furthermore we achieved microtopography detection of some insulated nanophase materials by STM. IPC -205B, which was developed by ourselves, and perfect three -dimensional microtopography images were obtained. In this way, the application of STM is exploit preferably in the realm of detection and processing, and the predominance of STM, such as high resolution and stabilization, is further enhanced in the study of microtopography, structure and property of material surface.更多还原