【作者】 徐端颐； 谢登科；

【Author】 Xu Duanyi Xie Dengke(Optical Memory National Engineering Research Center at Tsinghua University Beijing 100084)

【机构】 清华大学光盘国家工程研究中心；

【摘要】 由于光盘存储记录信息符在录入或加工过程误差引起形变及光电探测系统中存在的各种干扰,使读出信号的前沿和后沿产生波动(抖晃).它将直接影响存储数据的可靠性,是评价高密度光盘读出信号质量的最基本的参数.本文介绍一种新的适合于各种高密度或高速度光盘读出信号的精密方法及测试系统,采用逻辑单元和信号传输延时原理实现了高速率光盘系统读出信号的抖晃测量.系统将边沿检测技术与脉冲计数法结合,在可编程门阵列FPGA芯片的基础上增加了自校准和信号处理模块,使测试精度及稳定性得到显著提高.实际测试实验证明本系统输入信号高于450MHz,适用于测量数据传输率40MB/s以上的高速率光盘信号的测试,精度可达到皮秒量级.系统本身的误差低于40ps,单发分辨率75ps,多发分辨率低于5ps,能用于单盘容量50GB或120倍速以上CD和20倍速以上DVD光盘读出信号的测试.更多还原

【Abstract】 The readout signal (jitter) testing for high-density or high-speed optical disk was most important in valuation parameter. A new testing technology, which was suitable for difference high-density optical storage, is described in this paper. It is the two-step cascading delay line method, which is utilizing the gate and route propagation delay. The system was implemented on a Field-Programmable Gate Array (FPGA) device and a self-calibration module with input signals frequency of 450 MHz. It was proved by experiments that can be used to measure optical discs of data rate over 40 MB/s with Pico second level accuracy.. The error of the system is within 40 ps with 75 ps single shot resolution and 5 ps statistical multi-shot resolution. So it could be applied to testing for capacity 50GB per disk or CD at a maximum speed of 120X and DVD at 20X.更多还原