【作者】 包生祥； 王守绪； 范荣奎； 赵登华；

【Author】 Bao Shengxiang Wang shouxuSchool of Microelectronics and Solid-state electronics, University of Electronic Science and Technology of China, Chengdu, 610054, P. R. ChinaFan Rongkui Zhao Denghua State-owned No.745 Factory, Chengdu, 610051, P. R. China

【机构】 电子科技大学微电子与固体电子学院； 国营745厂；

【摘要】 本工作根据行波管用的关键材料—钨铼合金中高含量铼测定的需求,分析了用X-射线荧光(XRF)光谱法测定铼时所存在的基体效应、谱线重叠和背景干扰的影响,从理论上解释了XRF二元比例法校正曲线线性差的原因。理论和实验结果均表明:直接用ReLα分析线强度绘制的校正曲线比二元比例法可以获得更好的线性。本法具有快速准确的特点,分析结果与化学方法一致,在生产控制中应用效果显著。更多还原

【Abstract】 The matrix effect, spectral overlap and background were investigated for x-ray fluorescence (XRF) spectrometric determination of rhenium content according to the analysis requirement of rhenium-tungsten alloys, a key material used in traveling wave tube. The reason for caused calibration curve nonlinear was explained theoretically when binary ratio technique of XRF was used. Both theoretical and experimental results showed that linear calibration curve could be obtained if the curve is plotted by Re% vs. ReLα x-ray intensity instead of binary ratio technique. The method is rapid and accuracy and the results obtained in this work are in good agreement with those of chemical analysis. The method has been successfully applied to product quality control.更多还原