【作者】 韩培德； 梁建； 杜高辉； 许并社； 彭练矛；

【Author】 Han Peide, Liang Jian, Du Gaohui, Xu Bingshe, Peng LianmaoCollege of Materials Science and Engineering, Taiyuan University of Technology, Taiyuan 030024, ChinaBeijing Laboratory of Electron Microscopy, Institute of Physics, Chinese Academy of Science, P.O. Box603, Beijing 100080, China

【机构】 太原理工大学材料科学与工程学院； 中国科学院物理研究所电子显微镜重点实验室；

【摘要】 X射线粉末衍射是材料结构表征的主要方法,利用X射线衍射数据可以确定材料的晶粒尺寸、内应力等参数,然而纳米材料由于尺寸效应,使X射线衍射峰严重宽化,本文采用Rietveld方法对K₂Ti₆O₁₃纳米线的X射线衍射谱进行了分析,并和微晶K₂Ti₆O₁₃材料进行了比较。更多还原

【Abstract】 X-ray powder diffraction is at present the dominant technique for characterizing the structure of bulk materials For microcrystals information concerning the particle size and internal stress may also be obtained from X-ray diffraction (XRD) from the broadening of diffraction lines. However, nanocrystalline materials give rise to much broader diffraction peaks, and consequently very often XRD cannot provide high quality data for a full determination of structural parameters and consequent refinement of the structure. In this report, the Rietveld powder diffraction profile fitting technique is used for the refinement of the XRD profiles obtained from the K2Ti6O13 nanowires,and the result is compared to that of microcrystalline K2Ti6O13.更多还原