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X射线光电子能谱仪探测效率的研究
An Investigation on the Measurement of Detective Efficiency in XPS Spectrometer
【Author】 Wu Chunli Yu Baoqi Bai Zhiming(Northeastern University,Shenyang 110006,China) (Benxi metallurgy technical college,Benxi 117022,China)
【摘要】 探测效率是X射线光电子能谱仪一个很重要的仪器参数。本文提出了两种测量谱仪探测效率的方法,并对国产的NP-1A型XPS谱仪的探测效率进行了测量。根据谱仪的探测效率曲线可以对原子灵敏度因子进行定标,这对于XPS定量分析具有很重要的应用价值。
【Abstract】 Detective efficiency is an important instrumental parameter of X-ray photoelectron spectrometer.Two kinds of methods are presented for the measurement of detective efficiency in the paper,and the detective efficiency of NP-1A spectrometer made in China has been acquired.Atomic sensitivity factors can be calibrated by using the curve of detective efficiency.It plays an important role in XPS quantitative analysis.
【关键词】 XPS谱仪;
探测效率;
原子灵敏度因子;
【Key words】 XPS spectrometer Detective efficiency Atomic sensitivity factors;
【Key words】 XPS spectrometer Detective efficiency Atomic sensitivity factors;
- 【会议录名称】 中国仪器仪表学会第三届青年学术会议论文集(下)
- 【会议名称】中国仪器仪表学会第三届青年学术会议
- 【会议时间】2001-08
- 【会议地点】中国沈阳
- 【分类号】TH842
- 【主办单位】中国仪器仪表学会、沈阳市科协