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TFT-LCD亮点缺陷的分析与研究

Analysis and Research of TFT-LCD Bright Defect

【作者】 杨敏

【导师】 李国强; 陈刚;

【作者基本信息】 华南理工大学 , 工程硕士(材料工程)(专业学位), 2019, 硕士

【摘要】 最近几年,我们国家的事业群积极布局和进军液晶面板这个领域,中国液晶面板市场正成为世界的舞台,如何在激烈的竞争中生存成为考验面板企业的新问题。然而,相对于其他国家的面板企业,原材料、显示技术和产业链布局,我们存在差距,且受到很大的制约,从生产良率的改善出发可以快速摆脱困境,达到提升企业利润的目的,让面板企业具有竞争力。为了提升生产良率,先对良率的缺失进行研究,用柏拉图分析数据,研究效益最大化,明确了亮点类占比最大。然后,从缺陷的品质规格数据分析,确认客户对亮点的要求最为严苛。在此基础上确定了亮点缺陷的研究课题。改善亮点缺陷通过数据采集的方法,结合TFT LCD理论基础和工艺流程,首先分析产品设计差异与亮点缺陷的线性关系,确认产品设计的不足;然后对缺陷检测设备研究,确认了亮点类缺陷检测存在漏放的问题;最后是研究亮点缺陷产生的原理模型,配合案例分析,发现修补手法的缺失。在产品设计上,通过测试关键存储电容器件特性的差异,结合理论模型提出通过改善设计驱动,利用实验验证,确定调整最佳v-com可以一定程度上降低亮缺陷的灰度值。在产品检测上,关于降低亮点缺陷检测漏放的问题,对设备的检测原理和流程进行推导,分析结果证实光学和电测设备检测出的缺陷,存在一定概率漏检出而造成漏修补,针对检测重新设计新的流程,通过在设备软体上新增缺陷叠图定位的功能,实现亮点类缺陷漏放的改善。在产品修补上,分析现有亮点缺陷的修补规则,研究提出一种新的修补方法,通过多批量的实验方式验证,确定直线修补可以改善亮点缺陷的修复成功率,降低面板的报废率,从而提高修补效率。综合从产品设计、产品检测及产品修补三个维度深入研究,分别提出亮点缺陷的改善策略,结合实际的测试和验证,把合理有效的改善策略应用于面板企业,达成通过亮点缺陷的研究和改善提升产品的生产良率,增强了企业的竞争力。

【Abstract】 In recent years,our country’s business group has actively arranged and entered the field of liquid crystal panel.The Chinese liquid crystal panel market is becoming the world stage.How to survive in the fierce competition has become a new problem for panel companies.However,compared with panel enterprises in other countries,we have a gap in raw materials,display technology and industrial chain layout,and are greatly restricted.Starting from the improvement of production yield,we can quickly get out of the dilemma,achieve the purpose of improving enterprise profits,and make panel enterprises competitive.In order to improve the yield of production,first of all,the lack of yield was studied.With Plato’s analysis data,the research benefits were maximized,and it was clear that the proportion of bright spots was the largest.Then,from the analysis of defect quality specification data,it is confirmed that customers’ requirements for highlights are the most stringent.On this basis,the research topic of bright spot defect is determined.Improve the method of data collection for bright spots and defects,combined with TFT LCD theoretical basis and technological process,first of all,analyze the linear relationship between product design differences and highlight defects,and confirm the deficiencies of product design;then study the defect detection equipment,and confirm that there is a problem of omission in the detection of highlight defects;finally,study the theoretical model of highlight defects,cooperate with case analysis,and find the lack of repair methods.In the product design,through testing the difference of the characteristics of the key storage capacitor devices,combining with the theoretical model,it is proposed that by improving the design driver,using the experimental verification,determining the optimal v-com can reduce the gray value of the bright defects to a certain extent.In terms of product detection,as for the problem of reducing the detection and leakage of bright spot defects,the detection principle and process of the equipment are deduced,and the analysis results prove that the defects detected by optical and electrical measuring equipment have a certain probability of omission,which results in leakage repair.For the detection,a new process is redesigned,through adding the function of defect overlay positioning on the equipment software,the defect leakage of bright spot type is realized Improvement of release.In terms of product repair,this paper analyzes the repair rules of existing bright spot defects,studies and puts forward a new repair method,which can improve the repair success rate of bright spot defects,reduce the scrap rate of panels,and improve the repair efficiency through multi batch experimental verification.Comprehensive in-depth research from three dimensions of product design,product detection and product repair,respectively,put forward the improvement strategies of highlight defects,combined with the actual testing and verification,apply the reasonable and effective improvement strategies to panel enterprises,achieve the research and improvement of highlight defects to improve the production yield of products,and enhance the competitiveness of enterprises.

  • 【分类号】TN873.93
  • 【被引频次】1
  • 【下载频次】216
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