【作者】 胡慧；

【导师】 徐晓辉；

【作者基本信息】 河北工业大学 ， 物理电子学， 2007， 硕士

【摘要】 随着集成电路的快速发展,为了提高产品性能、降低芯片面积和费用,需将数字和模拟元件集成在同一块芯片上。据资料报道,虽然模拟部分仅占芯片面积的5%,但其故障诊断成本却占总诊断成本的95%。模拟电路故障诊断一直是集成电路工业中的一个“瓶颈”问题。以神经网络为代表的计算智能技术为模拟电路故障诊断提供了一条有效途径。本文在吸取众多模拟电路故障诊断研究成果的基础上,结合当今测试技术和人工智能技术的最新成果,针对目前模拟电路故障诊断中存在的容差和非线性特性所带来的诊断难点,以神经网络在模拟电路故障诊断中的应用为主线,研究了模拟电路的故障特征提取和故障诊断方法。论文的主要工作有如下两个方面:1.研究了模拟电路故障特征提取方法,包括:(1)粗糙集理论利用粗糙集理论剔除样本信息中存在的冗余成分,提取关键信息。(2)主元分析法利用主元分析压缩特征向量的维数,从而简化神经网络结构,提高了网络的训练速度与诊断效率。2.研究了确定BP神经网络结构的方法探讨了BP神经网络各参数的确定方法,分析了网络参数变化对训练结果的影响并确定了实际问题的神经网络结构。本文所提出的实现方法对具有容差的模拟电路进行了较准确的诊断,达到了预期目的。更多还原

【Abstract】 With the fast developing of IC, in order to improve product’s capability, reduce chip’s area and expense, we should integrate digital and analog component into one chip. From the statistic number we can learn that there are 95 percent fault resulted from analog circuit, though only 5 percent of chip’s area. Fault diagnosis of analog circuit always a difficult problem on IC industry. Neural networks, which are a typical representation of Computational Intelligence, provide a powerful way to diagnose faults of analog circuits.At the basis of the former accomplishment, I combine the electronic measurement with the artificial intelligence in the system’s organizing and designing. Directed toward tolerance and nonlinear of analog circuit, this dissertation based on NN profoundly studies fault feature extraction and fault diagnosis methodology. Thesis’s main work concentrates on two aspects as follows:1. On fault feature extraction for analog circuits.(1) Rough setEliminate redundancies and incompatibilities in samples, extract the key information, et al.(2) Principal Component AnalysisFeature parameters of the step response are compressed using principal component analysis (PCA). It has many good properties, such as simplifying the structure of NN, improving the training speed and fault coverage.2. Construct the structure of neural networkAnalysed the structure of neural network, evaluate the diagnosis result with different neural network structures and different parameters, confirm the structure in the practical application. The experimental results show that the proposed method can perform correct diagnosis in the linear analog circuits with tolerances.更多还原