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高Q值音叉调制近场光学扫描显微镜研究
Near-field Optical Microscopy Using High Q Factor Tuning Fork as Force Sensor
【作者】 高明;
【导师】 吴世法;
【作者基本信息】 大连理工大学 , 光学, 2005, 硕士
【摘要】 近场光学显微镜日益成为纳米检测中一种重要的手段,而使用非光学方法进行针尖样品之间距离调制成为一个热点问题。使用石英调音音叉作为驱动光纤尖的力敏感器由于具有高Q值,制造成本低,仪器结构简单,灵敏度高等优点,成为非光学调制中一种重要的方法之一。本文围绕音叉调制的原子力/近场光学显微镜(AF/PSTM)的仪器设计,详细讨论了音叉驱动的近场光学扫描显微镜原理,高Q值调音音叉/光纤尖力敏感元件设计,振幅反馈音叉驱动系统设计,并讨论了适用于所有扫描近场显微镜的针尖尺度对成像影响问题。
【Abstract】 Near-field scanning optical microscopy has already been an important instrument in nanometer scale detect, one of the important component of a near-field scanning optical microscope is the feedback distance control. That maintains the tip at constant height above the sample especially using nonoptical means has been a hotspot question. Using tuning fork as force sensor has been an important means of nonoptical control for advantages such as high Q factor, low cost, simple configuration, high resolution etc. In this article, we describe an implementation of a tuning fork sensor suitable for AF/PSTM, we particularly discuss the principle of SNOM using tuning fork, design of high Q factor tuning fork/optical fiber force sensor, design of driving system of amplitude feedback using tuning fork and at last we discuss the question of the effect of the scale of optical fiber tip to the imaging.
【Key words】 Nanometer detection; Near-field scanning optical microscopy; Tuning fork;
- 【网络出版投稿人】 大连理工大学 【网络出版年期】2005年 03期
- 【分类号】TH742
- 【被引频次】4
- 【下载频次】222