节点文献
基于IEEE1445标准的电路故障诊断技术研究与实现
The Study and Implement of Circuit Fault Diagnosis Based on IEEE1445
【作者】 陈亮;
【导师】 魏蛟龙;
【作者基本信息】 华中科技大学 , 通信与信息系统, 2004, 硕士
【摘要】 标准化是当今测试技术发展的趋势,IEEE1445是数字电路诊断中一个十分重要的国际标准,它为众多的ATE设备制造商提供了一个输入测试码的通用标准,依据该标准来设计和制造自动测试设备,可以有效的延长ATE的生命周期和扩展它的适用范围。在利用IEEE1445标准来完成电路板的故障诊断时,矢量的约简是整个测试程序开发过程中的一个难点。本文在深入研究粗糙集理论的基础上,提出了利用可辩识矩阵和分辨函数来提取最小测试集的约简算法,试验结果表明该算法在保证故障覆盖率的前提下,能够有效的优化测试激励集。IEEE1445标准共涉及总计39个不同内容的数据文件,每个文件有自己特定的格式规范,分别描述了用于电路板诊断所需的详细信息,其中包括各种激励、输入输出管脚、故障的名称、对应的输出模式等信息。这些数据文件可组织成4个不同的功能组:UUT模型组、激励与响应组、故障字典组和探针组。本文详细的介绍了IEEE1445标准所涉及到的三种诊断方式:端到端、故障字典、探针,而且对这三种诊断方式的诊断机理做了深入的讨论,最后以流程图的方式描述了三种诊断方式的具体实现过程。另外,以中国北京航天测控公司支持的“板级产品故障诊断软件开发平台”项目为背景,本文采用COM组件技术实现了基于IEEE1445标准的故障诊断模块,并将其集成到整个软件开发平台中。最后本文给出了应用IEEE1445标准来完成具体诊断任务的实例,诊断结果表明基于IEEE1445标准的故障诊断模块能高效的完成实际的故障诊断任务,具有很强的实际意义。
【Abstract】 Trend of the Current diagnostic technology is Standardization. IEEE1445, a crucial criterion in the domain of Digital Test technology, is a important international standard for digital test .it ,IEEE1445,provides a universal format of test import code for the numerous test equipment manufacturers Conform to the standard, the scope of and lifecycle of automatic test equipment will be prolonged.During the period of employing IEEE1445 to resolve the problem of fault diagnose, the test vector set’s reduction is a hard problem to the entire developing process . After studying the Rough sets theory in-depth, a reduction algorithms inferred from discernibility matrix and discernibility function which can be likely to reduce the dimension of the test vector sets is putted forward here .on the premise of maintaining the ratio of fault coverage, the experiment result indicates that the algorithm could compress the test vector sets effectively.A total of 39 data files, each of which has distinct specifically format criterion, is involved in the standard of IEEE 1445.The detailed information ,which includes all kings of stimulus 、the names of input and output pins and the corresponding pattern for circuit diagnose, is described in these files. All these files are organized into four functional groups .They are UUT model group 、stimulus and response group、fault dictionary group and probe group. Different test methods, end to end fault Dictionary and probe based on the standard ,are described detailed here. Diagnostic mechanism of three kind of test methods is discussed embedded in this thesis The material realization flows based on different test methods are particular described in manner of chart .In addition., based on the “Platform for Developing Fault Diagnosis System of Circuit Board”, the Diagnosis module for Circuit Board based on the standard of IEEE1445 utilizing the COM technology is realized in this paper. The module is integrated into the platform for developing fault diagnosis systems of circuit boards A <WP=5>example that applying the Diagnosis module to accomplish some particular diagnose mission is introduced in the paper. The diagnosis result shows that the Diagnosis module, which could finish the actual diagnose mission efficient, would take on practicality signification.
- 【网络出版投稿人】 华中科技大学 【网络出版年期】2005年 02期
- 【分类号】TN707
- 【被引频次】2
- 【下载频次】297