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激光电离质谱技术分析无机固体材料的研究进展

Research Progress in Analysis of Inorganic Solid Materials Using Laser Ionization Mass Spectrometry

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【作者】 崔云; 杨晓宇; 陶春先; 刘世杰; 陈剑飞; 邵建达;

【Author】 Cui Yun;Yang Xiaoyu;Tao Chunxian;Liu Shijie;Chen Jianfei;Shao Jianda;School of Optical-Electrical and Computer Engineering, University of Shanghai for Science and Technology;Department of High-Power Laser Optics Technology and Engineering, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences;Key Laboratory of Materials for High Power Laser, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences;China-Russia Belt and Road Joint Lab on Laser Sciences;

【通讯作者】 崔云;陶春先;刘世杰;

【机构】 上海理工大学光电信息与计算机工程学院; 中国科学院上海光学精密机械研究所高功率激光元件技术与工程部; 中国科学院上海光学精密机械研究所强激光材料重点实验室; 中国-俄罗斯“一带一路”激光科学联合实验室;

【摘要】 激光电离质谱(LIMS)技术是一种用于检测样品组成成分的分析技术。该技术使用激光烧蚀样品表面产生等离子体,等离子体中的离子被传输至离子质量分析仪中进行检测分析。在19世纪七八十年代,受限于激光器的性能,LIMS技术由于较低的分辨率和灵敏度逐渐被其他质谱技术替代。但是,随着现代激光器性能的逐渐提高,LIMS技术已经可以实现高准确度的成分分析和高分辨率的成分成像。综述了LIMS技术的原理、特点,介绍了固体-激光相互作用的过程、离子产生的规律以及常用的离子质量分析技术的原理,回顾了近些年LIMS技术在无机固体材料检测方面的应用,并对LIMS技术的未来发展和应用进行了展望。

【Abstract】 Significance The analysis technology for solid components has important applications in fields such as chemistry, materials science, and geology. By analyzing specific elements or isotopes in a sample, we can accurately evaluate and analyze the processing technology and age of the sample. Mass spectrometry(MS) is a commonly used solid-state analytical technique. It identifies the types and contents of chemical components in the sample by measuring the mass-to-charge ratios of ions excited from the sample surface.Laser ionization mass spectrometry(LIMS) combines laser and mass spectrometry techniques. When the sample is irradiated with a laser, the atoms and molecules on the surface of the sample absorb energy and undergo ionization. The generated ions are then detected and analyzed using a mass spectrometer. Over the last century, LIMS has rarely been applied because of the limited performance of lasers and instruments. However, with the emergence of femtosecond lasers and innovative instruments, LIMS can satisfy the requirements of high-accuracy element analysis and high-resolution element imaging. Compared to other mass spectrometry techniques, LIMS has the following advantages: 1) direct analysis of samples without the need for complicated preparation; 2) high utilization rate of the sample and minimal damage to the sample surface; 3) reduced sample damage and matrix effects because of the use of ultrashort pulse lasers(such as femtosecond lasers). These characteristics are beneficial for the direct semi-quantitative analysis of unknown samples without standards.In the past few decades, numerous studies have thoroughly investigated the performance of LIMS, covering a range of topics, from the theory of laser– solid interactions to the impacts of various laser parameters and instrument configurations on the final test results. Investigations have also extended to the analysis of industrial technologies and geological samples, leading to significant advancements in this field. Therefore, it is essential to summarize the existing research and provide an outlook for future developments.Progress First, the principle of laser-solid interactions and the differences between nanosecond and femtosecond lasers in their interactions with solids(Fig. 3) are briefly introduced, Thereafter, the influence of laser parameters on laser ablation, including laser power density, wavelength, and pulse duration, is discussed. A brief overview of commonly used mass spectrometry techniques is introduced(Fig. 8 and Table 1), with a particular focus on two high-resolution mass spectrometry techniques that are easily coupled with laser systems: time-of-flight mass spectrometry(TOF-MS) and electrostatic ion trap mass spectrometry. The basic principles and advancements in these two instruments are introduced.The application of LIMS to solid analysis is then discussed. A new LIMS system developed by Bern University is presented, with a comprehensive analysis of its instrument design(Fig. 15) and performance, demonstrating its capability for solid elemental detection. A double-pulse LIMS instrument introduced in 2018, which offers higher resolution than conventional systems, has been validated for metal thin-film detection. Other LIMS studies have demonstrated the potential of this technology for metal and alloy samples.In addition, a series of experiments have been conducted on semiconductor industry technologies, such as Cu interconnects and through-silicon via(TSV). By using LIMS scan and depth analysis, better ways to reduce contaminants in semiconductors and the necessary information for a better understanding of the mechanism and process of TSV filling are provided. LIMS has also been used to analyze geological and planetary samples. Information on ancient oceanic properties and rock characteristics can be obtained by studying the properties of micrometer-sized inclusions and filamentous structures in rocks. The analysis of biologically related elements(C, H, O, N, Fe, etc.) in planetary samples can provide evidence for the existence of life on planets.Conclusions and Prospects After decades of development, LIMS has gradually matured and become a powerful tool for solid analysis, with detection capabilities comparable to or surpassing those of any mass analysis technology available today. Compared with the nanosecond laser, the femtosecond laser has a lower dependence on wavelength and material and is able to reduce matrix effects, minimize thermal effects, and produce smaller and more limited ablation craters, thus achieving a higher resolution. Experiments have shown that under the same conditions, an ultraviolet laser can further reduce matrix effects, improve spatial resolution, and increase ion yield compared to longer-wavelength lasers. With technological advancements, artificial intelligence(AI) has become a part of our society. In the future, a combination of AI and LIMS is expected. By combining AI with LIMS, complex datasets can be analyzed using big data, real-time changes to LIMS instrument parameters can be made, and the detection capability for complex and heterostructure samples can be improved.

【基金】 中国科学院国际交流计划(PIFI)(2025PVA0017);上海理工大学专业学位研究生实践基地项目(23-24-302-001)
  • 【文献出处】 中国激光 ,Chinese Journal of Lasers , 编辑部邮箱 ,2025年11期
  • 【分类号】O657.63;TB321
  • 【下载频次】8
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