节点文献
合肥先进光源中能显微谱学成像线站(特邀)
Tender Microscopic Spectroscopy Imaging Beamline at Hefei Advanced Light Facility (Invited)
【摘要】 基于衍射极限储存环的第四代同步辐射光源,通过将电子束的横向发射度降低到接近X射线波长的衍射极限,可实现前所未有的高亮度和高相干性。正在建设的合肥先进光源,正是第四代同步辐射光源。中能显微谱学成像线站是其首批建设的线站之一,建成后可基于扫描相干衍射成像和全场透射成像技术,实现纳米级分辨率的X射线显微三维成像和谱学成像。介绍了中能显微谱学成像线站,包括线站设计指标、成像方法以及实验条件,以便线站的潜在用户和关心合肥先进光源建设的相关领域学者更好地了解其特点和优势,促进其在生命科学、材料科学、能源技术等领域的科研与应用。
【Abstract】 The fourth-generation synchrotron radiation source, based on diffraction-limited storage rings, achieves unprecedented brightness and coherence by reducing the transverse emittance of the electron beam to approach the diffraction limit of the X-ray. The Hefei Advanced Light Facility(HALF), currently under construction, represents such a next-generation facility. One of its initially built beamlines, the Tender Microscopic Spectroscopy Imaging Beamline, which will offer nanoscale-resolution three-dimensional and spectroscopic X-ray imaging through Ptychography and fullfield transmission X-ray microscopy techniques. This study presents the beamline’s design specifications, imaging methodologies, and experimental conditions, offering both potential users and the broader scientific community an overview of its unique capabilities. The beamline is expected to play a pivotal role in advancing research across diverse disciplines, including life sciences, materials science, and energy technology.
【Key words】 synchrotron radiation; microscopy; spectral imaging; fourth generation light source;
- 【文献出处】 激光与光电子学进展 ,Laser & Optoelectronics Progress , 编辑部邮箱 ,2025年24期
- 【分类号】TL594
- 【下载频次】10