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VA140的单粒子闩锁试验研究

Study on VA140 Single-event Latch-up Experiment

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【作者】 张云龙崔兴柱龚依民彭文溪王焕玉张飞樊瑞睿梁晓华高旻龚珂王钇心杨彦佶祝贵阳刘彦良祝晓龙

【Author】 ZHANG Yun-long;CUI Xing-zhu;GONG Yi-min;PENG Wen-xi;Wang Huan-yu;ZHANG Fei;FAN Rui-rui;LIANG Xiao-hua;GAO Min;GONG Ke;WANG Yi-xin;YANG Yan-ji;ZHU Gui-yang;LIU Yan-liang;ZHU Xiao-long;College of Physics,Jilin University;Institute of High Energy Physics Chinese Academy of Sciences;

【机构】 吉林大学物理学院中国科学院高能物理研究所

【摘要】 专用集成电路是为特定用户或特定电子系统制作的集成电路,具有高性能、高可靠性等优点。专用集成电路VA140是中国暗物质卫星有效载荷硅微条探测器的关键器件。为测试VA140的抗单粒子闩锁特性,设计了简单的测试系统。应用兰州近代物理研究所重离子加速器进行测试,得到了有效试验数据。对试验数据进行处理,得到了VA140的闩锁截面与线性能量传输值的关系曲线、VA140的闩锁阈值及饱和截面,为其航天应用提供必要试验依据。

【Abstract】 Application specific integrated circuit( ASIC) is the integrated circuit that made for specific users or electric systems with advantages of high performance and high reliability etc. ASIC VA140 is a key component of the silicon microstrip detector payload being assembled on Chinese Dark Matter satellite. A test system is designed to test the single-event latch-up( SEL) of VA140. The experiment was carried out at heavy ion accelerator lab in Lanzhou Institute of modern physics. A curve of latch profile VS LET was derived by the test data. The SEL threshold and the saturated section of VA140 were also derived by fitting with the formula of Weibull. The result is very important for this ASIC to be used in space application.

  • 【文献出处】 核电子学与探测技术 ,Nuclear Electronics & Detection Technology , 编辑部邮箱 ,2014年12期
  • 【分类号】V441
  • 【被引频次】3
  • 【下载频次】118
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