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抗辐射数字电路加固技术研究
Study of the Radiation-hard Ability of Digital Circuits
【摘要】 文章对电路抗辐射的机理进行了研究,提出了几种提高数字电路抗辐射能力的方法:通过工艺控制减小辐射后的背栅阈值电压漂移,通过版图增加体接触、采用环型栅等结构提高单元的抗辐射能力,通过对电路关键节点的加固提高整体电路的抗辐射能力。为了验证加固方法的可靠性,设计了一款电路进行抗总剂量、抗瞬态剂量率、抗中子辐射、抗单粒子辐射等多种试验。通过辐照试验结果可以看到,采用抗辐照方法设计的电路具有较强的抗辐照能力,为今后抗辐照电路的研制和开发奠定了坚实的基础。
【Abstract】 In this paper,we studied the mechanism of radiation and offered several optimization methods to improve the radiation-hard ability of digital circuits.According to the research,we decrease threshold voltage excursion by process control,improve the radiation-hard ability by adding body-contact and using round-gate,improve the radiation-hard ability of the key-point.This paper design a digital circuit to validate the radiation-hard method by total dose radiation experiment,trans-radiation experiment,neutron experiment and SEU experiment.According to the experiment results,the radiation-hard ability of the circuit is improved.
- 【文献出处】 电子与封装 ,Electronics & Packaging , 编辑部邮箱 ,2012年02期
- 【分类号】TN386
- 【被引频次】8
- 【下载频次】384