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椭圆偏振光分析法测定单轴晶体的折射率

Measuring the Refractive Indices of Uniaxial Crystal Using Elliptically Polarized Light

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【作者】 邢进华石芳

【Author】 XING Jin-huaa,b,SHI Fangb(a.Jiangsu Laboratory of Advanced Functional Materials;b.School of Physics and Electronics Engineering,Changshu Institute of Technology,Changshu 215500,China)

【机构】 常熟理工学院江苏省新型功能材料重点实验室常熟理工学院物理与电子工程学院

【摘要】 根据菲涅耳公式和光在晶体中的传播特性,分析了入射或反射椭圆偏振光长、短轴分量与s、p分量的关系以及晶体中的折射率与光轴方向的关系.在此基础上得到了测定单轴晶体折射率的一种行之有效的简单方法.通过测量椭圆偏振光的长、短轴分量并利用布儒斯特角的特点,就能完全确定单轴晶体的两个主折射率和光轴方向.实验证明这种方法是可行的,且测量精度比较高.

【Abstract】 By analyzing the common methods of measuring refractive index in a crystal,the authors of this paper try to get an easier and more effective way of acquiring refractive index of uniaxial crystal.Based on the Fresnel formula and the propagating characteristics of light in a uniaxial crystal,the relationship between s and p components with the long and short axes of the elliptically polarized light is analyzed in detail when an elliptically polarized light is incident on the sample surface of crystal.Also,the relationship between refractive index and the direction of optical axis is determined.Combining measurements of long and short axes of the incident and reflected elliptically polarized light with the nature of Brewster angle,the two principal refractive indices and the optical axis in a uniaxial crystal with buried optical axis are completely obtained.Experiment results confirm the accuracy and correctness of the method.

  • 【文献出处】 常熟理工学院学报 ,Journal of Changshu Institute of Technology , 编辑部邮箱 ,2012年08期
  • 【分类号】O734.2
  • 【下载频次】140
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