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Molecular beam epitaxy growth of InGaSb/AlGaAsSb strained quantum well diode lasers

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【作者】 张宇; 王国伟; 汤宝; 徐应强; 徐云; 宋国锋;

【Author】 Zhang Yu~1,Wang Guowei~2,Tang Bao~2,Xu Yingqiang Xu Yun~(1,+),and Song Guofeng~1 1 Nano-Optoelectronics Laboratory,Institute of Semiconductors,Chinese Academy of Sciences,Beijing 100083,China 2 National Laboratory for Superlattice and Microstructures,Institute of Semiconductors,Chinese Academy of Sciences, Beijing 100083,China

【机构】 Nano-Optoelectronics Laboratory,Institute of Semiconductors,Chinese Academy of Sciences; National Laboratory for Superlattice and Microstructures,Institute of Semiconductors,Chinese Academy of Sciences;

【摘要】 <正>2μm InGaSb/AlGaAsSb strained quantum wells and a tellurium-doped GaSb buffer layer were grown by molecular beam epitaxy(MBE).The growth parameters of strained quantum wells were optimized by AFM, XRD and PL at 77 K.The optimal growth temperature of quantum wells is 440℃.The PL peak wavelength of quantum wells at 300 K is 1.98μm,and the FWHM is 115 nm.Tellurium-doped GaSb buffer layers were optimized by Hall measurement.The optimal doping concentration is 1.127×1018 cm-3 and the resistivity is 5.295×10-3Ω·cm.

【Abstract】 2μm InGaSb/AlGaAsSb strained quantum wells and a tellurium-doped GaSb buffer layer were grown by molecular beam epitaxy(MBE).The growth parameters of strained quantum wells were optimized by AFM, XRD and PL at 77 K.The optimal growth temperature of quantum wells is 440℃.The PL peak wavelength of quantum wells at 300 K is 1.98μm,and the FWHM is 115 nm.Tellurium-doped GaSb buffer layers were optimized by Hall measurement.The optimal doping concentration is 1.127×1018 cm-3 and the resistivity is 5.295×10-3Ω·cm.

【关键词】 InGaSb; AlGaAsSb; strained quantum wells; Te doped;
【Key words】 InGaSb; AlGaAsSb; strained quantum wells; Te doped;
【基金】 Project supported by the Beijing Natural Science Foundation(No.4112058);the Science Foundation of the Chinese Academy of Sciences(No.CXJJ-11-M20)
  • 【文献出处】 半导体学报 ,Journal of Semiconductors , 编辑部邮箱 ,2011年10期
  • 【分类号】TN248.4
  • 【被引频次】11
  • 【下载频次】57
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