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Influence of substitution of Nd3+ for Bi3+ on structure and piezoelectric properties of SrBi2-χNdχNb2O9（χ=0,0.1,0.2 and 0.4）

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【作者】 孙琳； 褚君浩； 杨平雄； 越方禹； 李亚巍； 冯楚德； 毛朝梁；

【Author】 SUN Lin1,CHU Jun-hao1,YANG Ping-xiong1,YUE Fang-yu1,LI Ya-wei1,FENG Chu-de2,MAO Cao-liang2 1.Key Laboratory of Polar Materials and Devices of Ministry of Education,East China Normal University,Shanghai 200062,China; 2.Shanghai Institute of Ceramics,Chinese Academy of Sciences,Shanghai 200050,China

【机构】 Key Laboratory of Polar Materials and Devices of Ministry of Education,East China Normal University； Shanghai Institute of Ceramics,Chinese Academy of Sciences；

【摘要】 SrBi2-χNdχNb2O9(χ=0,0.1,0.2 and 0.4)bismuth layer-structured ferroelectric ceramics were prepared by the solid-state reaction sintering method.The accurate position of Nd element in SrBi2-χNdχNb2O9 ceramics was determined by the X-ray Rietveld method and Synchrotron radiation X-ray absorption fine structure(XAFS)technology.The partial substitution of Nd 3+ for Bi 3+ leads to the decrease in the distortion of NbO6 octahedron for SrBi2-χNdχNb2O9 ceramics and also lowers the piezoelectric properties of SrBi2-χNdχNb2O9 ceramics.Meanwhile,the temperature coefficient of resonant frequency(TCF)decreases when Nd element partially replaces Bi element in SrBi2-χNdχNb2O9 ceramics.

【Abstract】 SrBi2-χNdχNb2O9(χ=0,0.1,0.2 and 0.4)bismuth layer-structured ferroelectric ceramics were prepared by the solid-state reaction sintering method.The accurate position of Nd element in SrBi2-χNdχNb2O9 ceramics was determined by the X-ray Rietveld method and Synchrotron radiation X-ray absorption fine structure(XAFS)technology.The partial substitution of Nd 3+ for Bi 3+ leads to the decrease in the distortion of NbO6 octahedron for SrBi2-χNdχNb2O9 ceramics and also lowers the piezoelectric properties of SrBi2-χNdχNb2O9 ceramics.Meanwhile,the temperature coefficient of resonant frequency(TCF)decreases when Nd element partially replaces Bi element in SrBi2-χNdχNb2O9 ceramics.

【关键词】 bismuth layer-structured ferroelectrics； X-ray Rietveld method； synchrotron radiation XAFS； piezoelectric properties；
【Key words】 bismuth layer-structured ferroelectrics； X-ray Rietveld method； synchrotron radiation XAFS； piezoelectric properties；
【基金】 Project(20080440083)supported by China Postdoctoral Science Foundation;Project(2007CB924901)supported by the National Basic Research Program of China;Project(60677022)supported by the National Natural Science Foundation of China;Project(09ZR1409200)supported by the Natural Science Foundation of Shanghai,China
  • 【文献出处】 Transactions of Nonferrous Metals Society of China ,中国有色金属学报(英文版) , 编辑部邮箱 ,2009年06期
  • 【分类号】O611.3
  • 【被引频次】3
  • 【下载频次】52
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