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填样深度对多晶粉末X射线衍射仪测试结果的影响研究
Study on Effect of Fill-sample Depth on Determination with Polycrystal Powder X-ray Diffractometer
【摘要】 从理论和实验两个角度研究了填样深度对多晶粉末X射线衍射仪中实验结果——峰位、半高宽(FWHM)、衍射强度的影响。结果表明,在对称反射几何情况下,金属及其合金样品填样深度效应可以忽略,填样深度在0.2~0.5mm范围内能满足无穷厚度要求;对于绝大多数有机样品填样深度应不小于1.5mm。
【Abstract】 The influences of fill-sample depth on experimental results,such as peak position,half high width(FWHM) and diffraction intensity were investigated theoretically and experimentally with powder X-ray diffractometer.Results showed that the effect of fill-sample depth on metal and alloy could be neglected under symmetry reflection geometry.The fill-sample depth at the range of 0.2-0.5 mm could meet the requirement of infinitude thickness.For most of organic samples,the fill-sample depth should be greater than 1.5 mm.
【关键词】 填样深度;
多晶粉末;
X射线衍射仪;
峰位;
半高宽;
衍射强度;
【Key words】 fill-sample depth; polycrystal powder; X-ray diffractometer; peak position; half high width; diffraction intensity;
【Key words】 fill-sample depth; polycrystal powder; X-ray diffractometer; peak position; half high width; diffraction intensity;
- 【文献出处】 分析测试学报 ,Journal of Instrumental Analysis , 编辑部邮箱 ,2009年03期
- 【分类号】TH744
- 【被引频次】6
- 【下载频次】311