节点文献
Structural Evolution of SiC Films During Plasma-Assisted Chemical Vapour Deposition
【摘要】 <正> Evolution of chemical bonding configurations for the films deposited from hexam-ethyldisiloxane(HMDSO)diluted with H2 during plasma assisted chemical vapour deposition isinvestigated.In the experiment a small amount of CH4 was added to adjust the plasma environ-ment and modify the structure of the deposited Alms.The measurements of Raman spectroscopyand X-ray diffraction(XRD)revealed the production of 6H-SiC embedded in the amorphous ma-trix without the input of CH4.As CH4 was introduced into the deposition reaction,the transitionof 6H-SiC to cubic SiC in the films took place,and also the film surfaces changed from a struc-ture of ellipsoids to cauliflower-like shapes.With a further increase of CH4 in the flow ratio,theobtained films varied from Si-C bonding dominant to a sp2/sp3 carbon-rich composition.
【Abstract】 Evolution of chemical bonding configurations for the films deposited from hexam- ethyldisiloxane(HMDSO)diluted with H2 during plasma assisted chemical vapour deposition is investigated.In the experiment a small amount of CH4 was added to adjust the plasma environ- ment and modify the structure of the deposited Alms.The measurements of Raman spectroscopy and X-ray diffraction(XRD)revealed the production of 6H-SiC embedded in the amorphous ma- trix without the input of CH4.As CH4 was introduced into the deposition reaction,the transition of 6H-SiC to cubic SiC in the films took place,and also the film surfaces changed from a struc- ture of ellipsoids to cauliflower-like shapes.With a further increase of CH4 in the flow ratio,the obtained films varied from Si-C bonding dominant to a sp2/sp3 carbon-rich composition.
【Key words】 silicon carbide; plasma assisted chemical vapour deposition; structure;
- 【文献出处】 Plasma Science and Technology ,等离子体科学和技术(英文版) , 编辑部邮箱 ,2009年02期
- 【分类号】TN304.055