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PTCR综合参数测试仪

PTCR Integrated Characteristic Parameters Tester

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【作者】 黎步银; 汪洪; 黄慧勤; 谢京州;

【Author】 Li Buyin,Wang Hong,Huang Huiqin,Xie Jingzhou(Department of Electronic Science and Technology,Huazhong University of Science and Technology,Wuhan 430074,China)

【机构】 华中科技大学电子科学与技术系; 华中科技大学电子科学与技术系 武汉430074; 武汉430074;

【摘要】 结合了最新发展的虚拟仪器技术,从硬件和软件两方面介绍了PTCR综合参数测试仪的设计思想,采用计算机模拟编码,在单总线模式下,通过PC机并行口控制测试系统,采用VISUALC++6.0作为软件开发语言,可以测量PTC的电流时间特性,耐压老化特性以及伏安特性,测试结果由软件进行存储,计算,显示并打印。测试结果证明本系统较传统仪器有了很大进步,提高了测试效益。

【Abstract】 Combining the newly developed Virtual Instruments technology,this paper presents the design method of PTCR integrative parameter testing machine from both the hardware and software,simulating coding by computer,using the mode of 1-wire,controlling the instrument through parallel port of PC.Adopting VISUAL C++ 6.0 as the software develop language,it can be used to test I-T,V-I and aging characteristic of PTC and the testing results were stored,calculated,displayed and printed by software.It was proved that this system has been greatly improved than relative traditional separate instruments.The testing efficiency is been improved significantly.

  • 【文献出处】 现代科学仪器 ,Modern Scientific Instruments , 编辑部邮箱 ,2007年03期
  • 【分类号】TP274
  • 【被引频次】4
  • 【下载频次】93
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