【摘要】 采用化学溶液法在Si基衬底上制备了PbZr0.4Ti0.6O3/LaNiO3异质结构。X-射线衍射测量结果表明,制备的PbZr0.4Ti0.6O3/LaNiO3异质结构中PbZr0.4Ti0.6O3薄膜呈高度(100)择优取向;原子力显微镜测量表明制备的PbZr0.4Ti0.6O3薄膜的表面平整、均匀、结构致密;RT-66A测量表明,400 kV/cm的外加电场下,LaNiO3/PbZr0.4Ti0.6O3/LaNiO3结构具有优良的铁电性,剩余极化强度为14.6μC/cm2,矫顽电场为41 kV/cm。翻转1×108次极化下降小于10%,显示了很好的疲劳特性。并进一步研究了Pb含量对PbZr0.4Ti0.6O3薄膜的微结构和极化特性的影响。更多还原

【Abstract】 PbZr_0.4Ti_0.6O₃/LaNiO₃ heterostructures have been grown on Si-based substrates by chemical solution routes.The microstructure and morphology of the prepared PbZr_0.4Ti_0.6O₃ and LaNiO₃ thin films were investigated via X-ray diffractometry and atomic force microscopy techniques.PbZr_0.4Ti_0.6O₃ and LaNiO₃ show highly（100） orientation.The PbZr_0.4Ti_0.6O₃ thin films show smooth surface morphology,denser structure.At an applied electric field of 400 kV/cm,The remnant polarization（P_r） and coercive field（E_c） of the PbZr_0.4Ti_0.6O₃ thin films were obtained from the P-V loop measurements about 14.6 μC/cm² and 41kV/cm,respectively.LaNiO₃/PbZr_0.4Ti_0.6O₃/ LaNiO₃ show little polarization degradation after 108 fatigue cycles.The effect of Pb content in precursor solution on microstructure and polarization properties of LaNiO₃/ PbZr_0.4Ti_0.6O₃/ LaNiO₃ were investigated.更多还原