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分形多重相关方差X线颅颌影像边缘检测

Image edge detection of cephalogram based on multifractal multi-correlation variance

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【作者】 蒋爱平王祁

【Author】 JIANG Ai-ping~(1,2),WANG Qi~(2)(1.School of Electrical Engineering and Automatics,Harbin Institute of Technology,Harbin 150001,China 2.School of Electronic Engineering,Heilongjiang University,Harbin 150080,China)

【机构】 哈尔滨工业大学电气工程与自动化学院哈尔滨工业大学电气工程与自动化学院 哈尔滨150001黑龙江大学电子工程学院哈尔滨150080哈尔滨150001

【摘要】 针对X线颅颌影像片边缘检测十分困难的问题,提出一种基于多重相关方差的计算多重分形谱的算法.构建一个X线图像的五邻域多重相关空间,定义图像的多重分形谱的概率测度,对数字X线头影侧位片进行多重分形性质的分析.通过图像的多重分形谱与权重因子相关性的分析,进一步判定线形区间及适当的权重因子,得到X线头影片图像的多重分形的线性区间,验证X线头影片图像的多重分形的几何性质,实现对X线头影侧位片的整体轮廓的边缘提取.该算法具有保持和加强图像的局部特性,突出图像的细微处的特点,克服了多重分形谱对噪声敏感的缺点,能有效抑制图像中的噪声.

【Abstract】 Multi-correlation variance approach based on multifractal used to estimate the multifractal spectrum is introduced.The probability based on X-ray image multi-correlation space is defined that can be used to estimate the multifractal spectrum.The multifractal spectrum property of cephalogram is analyzed and the relationship between the multifractal spectrum and its weight is discussed,so the multifractal linear region of cephalogram is determined.The geometrical properties of its multifractal are verified.The result of the edge detection of cephalogram used the above approach shows that the noise can be repressed effectively,the local property of an image can be remained as much as possible and the fine property can be stressed.

【关键词】 分形多重分形边缘检测标志点头影测量
【Key words】 fractalmultifractaledge detectionlandmarkcephalometric
【基金】 黑龙江省自然科学基金资助项目(2004F0303);黑龙江省教育厅资助项目(10541173);黑龙江大学重点实验室资助项目(HDXH0505)
  • 【文献出处】 哈尔滨工业大学学报 ,Journal of Harbin Institute of Technology , 编辑部邮箱 ,2006年06期
  • 【分类号】TP391.41
  • 【被引频次】6
  • 【下载频次】95
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