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双极运算放大器辐射损伤的时间相关性
Time Dependence of Radiation Damage in Bipolar Operational Amplifiers
【摘要】 通过一系列辐照实验对双极运放辐射损伤的时间相关性进行了研究.结果表明,双极运放的辐射损伤与时间有着密切的关系,通过调整辐照剂量率、退火温度及时间等参数进行循环辐照-退火实验,可以测评出器件的低剂量率辐射损伤情况,并从界面态角度对这种损伤机理进行了分析.
【Abstract】 The time dependence of radiation damage in bipolar op-amps is studied through a series of radiation experiments.The results show that radiation damage in bipolar op-amps is closely related to time,and we can evaluate low-dose rate radiation damage in devices by adjusting radiating the dose rate,annealing temperature,and annealing time parameters to experiment on circulating radiation-anneal.From the interface states point of view,the possible mechanisms of radiation damage are also analyzed.
【关键词】 双极运算放大器;
辐射损伤;
时间相关性;
低剂量率;
加速评估;
【Key words】 bipolar operational amplifiers; radiation damage; time dependence; low dose rate; accelerated evaluation;
【Key words】 bipolar operational amplifiers; radiation damage; time dependence; low dose rate; accelerated evaluation;
- 【文献出处】 半导体学报 ,Chinese Journal of Semiconductors , 编辑部邮箱 ,2006年07期
- 【分类号】TN722.77
- 【被引频次】5
- 【下载频次】96