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一种用于制备安德鲁反射样品的新方法(英文)
A Novel Method of Nanocontact Fabrication for Andreev Reflection Measurement
【摘要】 提供了一种用于安德鲁反射测量样品制备新方法.该方法采用聚焦粒子束刻蚀和磁控溅射,可以获得可控的、干净的、无应力的纳米接触用于自旋极化探测.所制备的样品中,磁性和非磁性材料样品的反射谱都表现出复杂的峰和谷结构,这些结构可能源于与界面相关的零偏压反常以及与激发态相关的准离子相互作用.对另一个Co40Fe40B20合金样品采用简单的钕针尖压针方法进行了对比性测量,反射谱中没有观察到谷结构,但谱结构出现较明显的热扩展,这种热扩展可能来源于界面处的非弹性输运.所有的反射谱目前还不能由现有的理论给出令人满意的解释.利用点接触反射方法获得可靠的自旋极化信息还有赖于接触界面特征的进一步分析.而一个更切合实际的、更完善的理论成为迫切的需要.
【Abstract】 A new method of nanocontact fabrication for Adreev reflection measurement based on the nanopore method using a SiN membrane with focused ion beam technique is presented.With this method,controllable,clean,tensionless nano-contacts for spin polarization probing can be obtained.Measurements of the fabricated samples show complicated spectral structures with a zero bias anomaly and dip structures from quasipartical interactions.A control sample of Co40Fe40B20 is measured with Nb tip method.None of the measured spectra can be explained satisfactorily by present theory.Further analysis of the contact interface and a more complete theory are needed to extract a reliable spin polarization message with the point contact Andreev reflection method.
【Key words】 point contact Andreev reflection; controllable; spin polarization;
- 【文献出处】 半导体学报 ,Chinese Journal of Semiconductors , 编辑部邮箱 ,2006年04期
- 【分类号】TN304
- 【下载频次】69