【摘要】 X射线散射的存在严重影响了工业CT系统的性能,物体内部密度锐变区域的散射将可能引起重建图像严重的高频伪影,从而影响缺陷的检测,理论计算了不同材料交界面处的X射线散射引起的投影数据偏差的强度及分布,并通过MonteCarlo方法作了验证,在此基础上,简单分析了散射引起的伪影的表现形式。更多还原

【Abstract】 The existence of Compton scatter will lower the performance of ICT system. Scatter may evoke serious high-frequency artifacts near the sharp edge in reconstructed image, and thus influence the detection of defects. We developed a method to theoretically calculate projection error due to X-ray scatter near the boundaries of two different materials, and verified in with Monte Carlo simulation. According to the calculated results, we simply discuss the possible form of resulting high-frequency artifacts.更多还原