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BP-212正性光刻胶的抗蚀特性研究

Studies of the Corrosion Resistance of BP-212 Positive Resist

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【作者】 郑志霞; 冯勇建; 张丹; 林雁飞;

【Author】 ZHENG Zhi-xia1a,2,FENG Yong-jian1b,ZHANG Dan1a,LIN Yan-fei1a(1.Xiamen University a.Department of Mechanical & Electronic Engineer;b.Pen Tung Sah MEMS Research Center,Xiamen 361005,China;2.Department of Mechanical & Electronic Engineer,Putian University,Putian 351100,China)

【机构】 厦门大学机电工程系; 厦门大学萨本栋微机电研究中心; 厦门大学机电工程系 福建 厦门 361005 莆田学院机电工程系; 福建莆田351100; 福建 厦门 361005; 福建 厦门 361005;

【摘要】 BP-212正性光刻胶作为掩膜在BHF腐蚀液中腐蚀十几分钟后,光刻胶被腐蚀液破坏而浮胶。玻璃或热生长的二氧化硅深槽腐蚀时间要求几十分钟,传统解决办法是多次光刻腐蚀。本文研究了光刻胶抗腐蚀特性,得出足够的活化时间、合适的匀胶转速、多次坚膜腐蚀可以延长产生浮胶时间的结论。

【Abstract】 BP-212 positive resist used for mask would be destroyed after Si or SiO2 was eroded in BHF more than 10 min. Glass or SiO2 must be etched several-ten minutes to gain deep grooves. The traditional solution was repetitious lithography and etching. The corrosion resistance of BP-212 positive resist was studied in this paper. The time that BP-212 was destroyed would be prolonged under the conditions of enough activated time,appropriate spin speed and several times hardbake.

【关键词】 正性光刻胶; 掩膜; 坚膜; 湿法腐蚀;
【Key words】 positive resist; masking; hardbake; wet etch;
  • 【文献出处】 微纳电子技术 ,Micronanoelectronic Technology , 编辑部邮箱 ,2005年02期
  • 【分类号】TN405
  • 【被引频次】17
  • 【下载频次】679
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