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基于宽光谱扫描法的光学膜厚监控系统的研究

Study of Optical Filter Film Thickness Monitoring System Based on the Method of Wideband Spectrum Scanning

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【作者】 王海峰黄光周于继荣

【Author】 WANG Hai-feng, HUANG Guang-zhou, YU Ji-rong (Department of Electronic and Correspondance Engineering,South China University of Technology,Guangzhou 510640, China)

【机构】 华南理工大学电信学院物理电子与光电子系华南理工大学电信学院物理电子与光电子系 广东 广州 510640广东 广州 510640广东 广州 510640

【摘要】 简要介绍了光学滤光片的制造与使用状况,讨论了获得高质量的光学滤光片的条件,简单分析常用方法中光电极值法的固有缺陷,提出一种基于宽光谱扫描法的膜厚控制系统,重点介绍其监控原理、硬件系统及其控制流程,并对其性能进行分析和讨论。

【Abstract】 The status of manufacturing and application of optical filters were described in brief, discussing the conditions on how to obtain high quality filter film were discussed. And the inherent limitations of the method of photo-electricity limiting value in prevailing film monitoring methods were briefly analyzed. A film thickness monitoring system based on the method of wide band spectrum scanning was proposed, its principle, hardware system and controlling flow were introduced. Finally, the expectation of its application in the area of monitoring the narrow-bandwidth film was also discussed.

  • 【文献出处】 真空电子技术 ,Vacuum Electronics , 编辑部邮箱 ,2004年06期
  • 【分类号】O484
  • 【被引频次】6
  • 【下载频次】160
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