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工作气压对TiO2薄膜结构的影响

Investigation on structure of TiO2 films sputtered NiMnCo substrates

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【作者】 李哲奎顾广瑞孙文斗李全军赵永年

【Author】 LI Zhe-kui~1,GU Guang-rui~1,SUN Wen-dou~2,LI Quan-jun~1,Zhao Yong-nian~3 ( 1.Department of Physics, College of Science and Engineering, Yanbian University, Yanji 133002, China; 2.Yanbian Radio and TV University, Yanji 133001, China; 3.National Laboratory of Superhard Materials, Jilin University, Changchun 130012, China )

【机构】 延边大学理工学院物理系延边广播电视大学吉林大学超硬材料国家重点实验室 吉林延吉133002吉林延吉133002吉林延吉133001吉林长春130012

【摘要】 用射频磁控溅射方法以纯金属钛做靶材在氩氧混合气体中制备了TiO2薄膜,Raman光谱测量表明,工作气压从0.2Pa变化到2Pa时,TiO2薄膜的结构由金红石相变化到锐钛矿相,厚度对TiO2薄膜结构没有明显影响.

【Abstract】 Titainum dioxide (TiO2) films have been successfully deposited on NiMnCo (substrates) by radio-frequency (RF) magnetron reactive sputtering using pure Ti(99.99%) as the target and Ar mixed with N2 as reactivegas. The effects of gas total pressure on the structure and phase transition of TiO2 films were studied by Raman spectra. It is indicated that the film structure changes from rutile to anatase while work gas total pressure changes from (0.2)Pa to 2Pa. The structure of TiO2 films is not affected by the film thickness.

【关键词】 TiO2薄膜Raman光谱金红石锐钛矿
【Key words】 Titainum dioxide filmsRaman spectrumRutileAnatase
  • 【文献出处】 延边大学学报(自然科学版) ,Journal of Yanbian University (Natural Science Edition) , 编辑部邮箱 ,2004年02期
  • 【分类号】O614
  • 【被引频次】2
  • 【下载频次】113
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