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连接器外壳电磁屏蔽性能的FDTD分析

FDTD Analysis on The Shielding Effectiveness of Connector Enclosure

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【作者】 宋占海刘元安闫树兵黎淑兰

【Author】 Song Zhanhai, Liu Yuanan, Yan Shubing, Li Shulan(School of Electronic Information & Engineering, Beijing Univ. of Posts and Telecom. Beijing: 100876) (Zhangjiakou Industrial and Traffic School, Zhangjiakou, Hebei: 075131)

【机构】 北京邮电大学信息工程学院张家口工业交通学校北京邮电大学信息工程学院 北京:100876北京:100876河北 张家口:075131北京:100876

【摘要】 本文利用时域有限差分法对连接器技术腔体的电磁屏蔽性能进行了模拟,经分析模拟结果发现,虽然连接器两端有进线孔,但金属腔与封闭的腔体类似,进入腔内的电磁波仍能发生强烈的电磁振荡,这使腔体的电磁屏蔽性能被降低,可见,腔内介质的存在降低了腔体对低频的抑制能力,研究还发现金属腔对不同方向入射的电磁脉冲的屏蔽能力各不相同。

【Abstract】 Finite-difference time-domain (FDTD) method is used in the study for shielding effectiveness (SE) of connector enclosure. The simulation indicates that serious resonance has occurred inside the enclosure although there are two holes at the two ends, and that the introduction of medium inside the enclosure has caused the decrease of the SE. Besides, it was also revealed that the metal enclosure has different SE ability for electromagnetic pulse from difference direction.

  • 【文献出处】 北京电子科技学院学报 ,Journal of Beijing Electrenic Science and Technology Institute , 编辑部邮箱 ,2004年02期
  • 【分类号】TN03
  • 【被引频次】1
  • 【下载频次】117
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