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RTK像片控制测量及其精度检验

Photograph control survey of RTK and its precision examination

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【作者】 傅文祥詹登峰潘宝玉

【Author】 FU Wen-xiang1, ZHAN Deng-feng2, PAN Bao-yu1(1. Institute of Svrveying and Mapping of Geology, Jianan 250011, China;2. Beijing AMG C&N System CO., LTD, Beijing 100008, China)

【机构】 山东省地质测绘院北京麦格通信设备技术有限公司山东省地质测绘院 山东济南250011北京100008山东济南250011

【摘要】 通过RTK技术在临淄区12000比例尺像片控制测量中的应用,介绍了RTK测量的作业组织模式、基准转换参数的求解方法及RTK测量成果的精度检验等情况。其结果表明,RTK测量不仅能够满足12000比例尺像片控制测量精度要求,而且可以大幅度提高作业效率,尤其在通视困难地区更具明显优势。

【Abstract】 By the application of RTK in 1∶2 000 photograph control survey in Linzi district of Zibo city, the operation organization mode, solution of datum transformation parameters and precision examination of RTK measurement are introduced. The result shows that RTK measurement not only could meet precision requirements of 1∶2 000 photograph control survey but also highly enhance operation efficiency, especially in the area where intervisibiligy is difficult, it has obvious advantage.

  • 【文献出处】 测绘工程 ,Engineering of Surveying and Mapping , 编辑部邮箱 ,2004年01期
  • 【分类号】P228.4
  • 【被引频次】16
  • 【下载频次】86
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