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多晶硅、单晶硅同步外延研究(英文)
Study on Synchro-Epitaxy of Poly-and Single Crystal Silicon
【摘要】 介绍了多晶硅、单晶硅的同步外延 .采用两步外延工艺 ,研究了硅烷流量、外延时间以及外延温度对外延质量参数 α的影响 .硅烷流量大、初始诱生时间短 ,则单晶硅条宽 ,多晶硅横向蔓延弱 ,但外延层质量可能较差 .较优的条件是 :硅烷诱生生长流量为 13.1~ 17.5 sccm,正常生长流量为 7.0~ 7.88sccm,初始诱生时间为 30~ 5 0 s.温度影响较复杂 ,当温度低于 980℃时 ,单晶硅条宽随温度增加而增加 ,在 980℃附近达到最大 ,随后随温度增加单晶条宽降低
【Abstract】 Synchro-epitaxy is introduced and a “two periods epitaxy” process is proposed.The influence of the flows of SiH 4 N 1,N 2,deposition time t 1,t 2,and epitaxial temperature T on epilayer quality (embodied by α) is reported.The shorter initial inducing time t 1 and larger flows of SiH 4 are,the wider single crystal strips are.But the quality of epilayer may be poor.The optimum conditions are:N 1=13.1~17.5sccm,N 2=7.0~7.88sccm,and t 1=30~50s.The influence of temperature is complex:when T is lower than 980℃,single crystal strips increase with T ;when T is higher than 980℃,single crystal strips decrease with T.It reaches maximum near 980℃.
- 【文献出处】 半导体学报 ,Chinese Journal of Semiconductors , 编辑部邮箱 ,2004年11期
- 【分类号】TN304
- 【被引频次】3
- 【下载频次】268