【摘要】 文章介绍了Z衬度扫描透射电子显微术 (Z -scanningtransmissionelectronmicroscopy ,Z -STEM ,Z为原子序数 )的最新进展 :Z -STEM可以直接“观察”到晶体中原子的真实位置 ,Z衬度图像的分辨率在经过球差校正后可达 0 .6 ;在利用Z衬度成像技术对材料的阴极荧光 (cathodoluminescence ,CL)性质的研究中 ,首次观察到了“死层”(deadlayer)的存在 .然后 ,文章以半导体与结晶氧化物界面结构、Al72 Ni2 0 Co8十角形准晶结构以及SrTiO3晶界结构为例 ,具体介绍了Z衬度成像在测定物质结构与化学组成方面独特的优势 .更多还原

【Abstract】 Z\|contrast scanning transmission electron microsco py (Z\|STEM) can directly provide imaging at an atomic resolution. With the h elp of aberration correction, a resolution as high as 0.6 can be reached. In this article we will describe some typical applications of Z\|contrast STEM imaging. From the cathodoluminescent properties of Eu doped Y 2O 3 thin films , we reveal the presence of the "dead layer". Then, with three examples, we pr esent the unparalleled advantages of Z\|contrast imaging in determining the structure, physical properties and chemical composition of crystals.更多还原