【摘要】 文章介绍了用红外热像测温跟踪缺陷合成绝缘子的状况以及对其的电气试验情况,合成绝缘子运行中发热是因为内部界面缺陷局部放电引起的。对运行中同类型的合成绝缘子进行了普查,发现存在过热缺陷的合成绝缘子缺陷率高达20%以上。最后,文章分析了合成绝缘子产生界面缺陷的原因,指出2年一次的红外定期热像测温可以检测和监测此类界面缺陷。更多还原

【Abstract】 The situation of the tracing of defectivecomposite insulators which are partially overheated by infrared thermovision and the electrical testing to these insulators ispresented.The reason of overheating of composite insulators is the partial discharge caused by the defects at the internalinterfaces.The general investigation for the compositeinsulators of the same kind being operated is performed and it is discovered that more than 20% of the composite insulators are partially overheated.The auses of happening of thedefective interface in composite insulators are analyzed and it is pointed out that this kind of interface defect can beperiodically detected and monitored by biennial temperature measurement of infrared thermovision.更多还原