【摘要】 电源噪声在深亚微米设计中正变得越来越突出,而因电源噪声引起的电路故障测试也变得越来越重要。本文针对这一情况提出了动态电流测试来实现由电源噪声引起的故障测试。与IddQ测试不同,动态电流测试依据电路中的器件切换时电源电流的动态变化情况来判断电路中是否存在故障。通过仿真分析,动态电流测试是可行的。更多还原

【Abstract】 Power supply noise is more and more prominent during DSM (Deep Sub-Micrometer) circuit design, and testing of the faults caused by power supply noise is getting more important. For this reason, a dynamic current testing approach is proposed to test the faults caused by power supply noise. Different from IddQ testing, dynamic current testing judges the existence of fault in the circuit by power current changing during circuit switching. According to the analysis on simulation results, dynamic current testing is effective.更多还原