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带保护环结构的条形X光阵列探测器
Reduction of "Dead Region" of Silicon Stripe Detectors by Guard Ring Structure
【摘要】 研究了带有保护环结构的条形 X光阵列探测器 ,结果表明 ,保护环的存在不仅降低了表面漏电 ,而且抑制了耗尽区的侧向扩展 .厚度为 30 0 μm的探测器样品 ,切割后的“死区”长度为 15 0 μm;环境温度为 18℃时 ,70 V偏压下加保护环测得的探测器完全耗尽时的漏电流为 2 0 n A.
【Abstract】 A silicon stripe X ray detector with guard ring is studied.It is demonstrated that the guard ring can not only decrease the surface leakage current,but also prevent the lateral spreading from the depletion layer of pn junction.A "dead region" achieves for a strip detector on 300μm thick silicon wafer is 150μm.Dark current of the diode(with guard ring) under a voltage of 70V( the diode is completely depleted under this voltage) is 20nA at temperature of 18℃.
【关键词】 X光探测器;
死区;
漏电流;
保护环;
端面入射;
【Key words】 X ray detector; dead region; leakage current; guard ring; edge on;
【Key words】 X ray detector; dead region; leakage current; guard ring; edge on;
【基金】 国家自然科学基金 (批准号 :699760 0 6) ;北京市科技新星计划 (合同号 :95 2 870 3 0 0 );教育部优秀青年教师基金资助项目~~
- 【文献出处】 半导体学报 ,Chinese Journal of Semiconductors , 编辑部邮箱 ,2003年02期
- 【分类号】TN36
- 【被引频次】6
- 【下载频次】167