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轫致辐射能谱测定SSC高频腔体电压

Measurement of SSC RF cavity voltage with X-ray spectrum method

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【作者】 郑启文张生虎高宜海郁奇俞鸣峰

【Author】 ZHENG Qi-wen, ZHANG Sheng-hu, GAO Yi-hai, YU Qi, YU Ming-feng(Institute of Modern Physics, Chinese Academy of Science, Lanzhou of Gansu Prov. 730000, China)

【机构】 中国科学院近代物理研究所中国科学院近代物理研究所 甘肃兰州730000甘肃兰州730000甘肃兰州730000

【摘要】 介绍了利用轫致辐射能谱测定回旋加速器高频腔体电压的原理、方法及测量结果。该测量方法的优点在于采用非接触方式测量高频腔体电压 ,因而不改变高频腔体的谐振特性 ,并且不受高频频率的影响 ,测量的高频腔体电压准确可靠。

【Abstract】 This paper introduces the principle, method and results of RF voltage amplitude measurement by using X-ray energy spectrum. X-ray spectrum measurement method is one well-known method of absolute voltage measurement. It is based on the measurement of X-ray spectrum generated by field emitted (FE) electrons in RF cavity. The voltage amplitude of RF cavity measured by X-ray spectrum method is accurate and reliable. The DEE voltage of HIRFL-SSC cyclotron has been calibrated by X-ray spectrum measurement results.

  • 【文献出处】 核电子学与探测技术 ,Nuclear Electronics & Detection Technology , 编辑部邮箱 ,2002年06期
  • 【分类号】TL54
  • 【被引频次】2
  • 【下载频次】46
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