【摘要】 应用重离子加速器和 2 52 Cf源进行单粒子翻转效应实验 ,测量得到 IDT系列和 HM系列静态随机存取存储器的单粒子翻转重离子 L ET阈值为 4～ 8Me V· cm2 /mg,单粒子翻转饱和截面为 10 -7cm2 · bit-1量级 ,位单粒子翻转截面随集成度的提高而减小。实验结果表明 ,可以用 2 52 Cf源替代重离子加速器测量静态随机存取存储器的单粒子翻转饱和截面更多还原

【Abstract】 Single Event Upset (SEU) effects experiments were done under heavy ion accelerator and 252 Cf source. The SEU heavy ion LET thresholds were between 4～8MeV·cm 2/mg and the saturation SEU cross sections were of the order of 10 -7 cm 2·bit -1 , for IDT and HM series Static Random Access Memories (SRAMs). The SEU cross sections per bit decreased as the integration of devices increased. It is suitable to measure the saturation SEU cross section for SRAMs under 252 Cf source, instead of heavy ion accelerator.更多还原