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ZnO-B2O3-SiO2系统的相结构与介电性能的研究
Study on Dielectric Properties and Phase Struture of ZnO-B2O3-SiO2 System
【摘要】 对 Zn O- B2 O3- Si O2 三元系统进行了 XRD和介电性能定量关系的研究。系统的主、次晶相为 Si O2 、Zn2 Si O4相。调整各组分 ,获得了超低介电常数的介质陶瓷 ,其介电常数ε为 5 ,介电损耗 tanδ≤ 5× 10 - 4 ,容量温度系参数αc≤ (0± 30 )× 10 - 6 /°C、绝缘电阻 IR≥ 10 1 2 Ω ,烧结温度为 1140°C。并对系统进行了 X-射线分析 ,探讨了用X-射线衍射峰强度计算各物相含量的方法。
【Abstract】 Quantitative relation with dielectric properties and XRD pattern of the ZnO B 2O 3 SiO 2 system are studied in the paper.It is proposed that the main and minor phases of the system is cristobalite and some Zn 2SiO 4 phase.By adjusting the composition,we obtain a dielectric ceramic with extra low ε value.Its dielectric properties is ε ≈5,tan δ ≤5×10 -4 , α c≤(0±30)×10 -6 /°C, I R≥10 12 Ω,and its sintering temperature is 1 140 °C.XRD analysis is discussed on this system,and a method of calculation content of phase content in by X ray diffraction peak intensity is researched.
【Key words】 ZnO B 2O 3 SiO 2 system; extra low ε value; X ray analysis; diffraction peak intensity; phase content;
- 【文献出处】 压电与声光 ,Piezoelectrics & Acoustooptics , 编辑部邮箱 ,2001年03期
- 【分类号】TN405
- 【下载频次】112