【摘要】 利用同步辐射 X射线形貌术研究晶体缺陷 ,是近年来发展起来的一种优良的实验方法 .本文在研究LNP等晶体缺陷的同时 ,对这种实验方法进行了系统的探讨 ,讨论了散射光的消除、焦距的选择、样品的透明度与厚度、曝光的时间、底片的冲洗等问题 ,以及在缺陷研究中对晶体衍射的劳厄斑点的选取依据更多还原

【Abstract】 It is a good experimental method to study crystal defects with synchrotron radiation X ray topography. The experimental method is researched systematically while the defects of LNP crystal is investigated in this paper. It discusses the elimination of scattering light,selection of focal length,thickness and transparency of sample, exposure time, development of film, and the choice rule of Laue spots in crystal diffraction in researching crystal defects.更多还原