【摘要】 用电子束蒸发方法在硅衬低上制备ZnO薄膜,测量了ZnO薄膜的XRD谱,表明六角晶体结构的薄膜具有强C轴择优取向(002),并且,测量了ZnO薄膜样品的二次离子质谱(SIMS),表明其化学剂量比为1∶1。在光致发光实验中,用He-Cdi激光器的325nm(50mω)波长激发,观察到了385nm的紫外光发射。更多还原

【Abstract】 This paper has discussed on preparation ZnO pellicle on silicic underlay by using electron beam transpiration method,measured XRD of ZnO pellicle,indicated that the pellicle which have hexagonal crystal structure have strong tropism of c axis,furthermore,we measured SIMS of the ZnO samples,indicated the chemistry metric-ratio of it is1∶1.In the experiment of shining brought by lights,excitated by He-Cdi laser at325nm(50mω)wave length,we observed the ultraviolet radiation launching of 395nm.更多还原