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微弱电流及V/I法高电阻测量

Weak Current Measurement and High Resistance Measurement with V/I Method

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【摘要】 本文分析了影响V/I法高阻测量精度的主要因素,设计了以单片机为核心的高阻测量仪。采用加压测流的方案,运用双屏蔽输入电缆、优选输入级器件、隔离等关键技术,使电阻测量可达1016Ω,电流测量可达10-13A。

【Abstract】 This paper analyzes the main factor of affecting the measurement in high resistance measurement with V/I method, designs a high resistance measurement instrument based on microprocessor control. It uses some key technologies such as measuring resistance with V/I method, adopts two layers shielded input cable, selects proper input elements, analog circuit is isolated with digital circuit, etc. It measures the resistance as high as 10 16 and measures the current as weak as 10-13A.

  • 【文献出处】 国外电子测量技术 ,Foretgn Electronig Measurement Technology , 编辑部邮箱 ,2001年03期
  • 【分类号】TM934
  • 【被引频次】10
  • 【下载频次】344
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